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European Symp. on Reliability of Electron Devices, Failure Physics and Analysis

23-26 Sep 2019
Centre de Congrès Pierre Baudis - Toulouse (France)

This 30th edition of this international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Scientific domain : Micro and nanotechnologies/Microelectronics

Place of the conference
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